A true EMC noise scanner. It provides solutions for both EMI (emission) and EMS (immunity).
The innovative "Image Measurement Mode" eliminates the need for the traditional "contact and study" operation, allowing for quick execution from DUT setup to measurement completion with the scanner. The "Local Immunity Test" and "3D Measurement Function" provide new approaches to solving EMC issues. Additionally, the analysis software (viewer) is available for free download from the web. The overlay function for DUT images, CAD drawings, and noise maps is a standard feature.
- "Image Measurement Mode": Capture board photos ⇒ Set measurement area on the image ⇒ Height measurement using laser ⇒ Set measurement steps ⇒ Execute measurement.
- "Local Immunity Test": Visualizes the intrusion of electromagnetic fields from space using the electric/magnetic field irradiation probe of the MT-676E/H! Contributes to solving problems in challenging immunity scenarios.
- "3D Measurement Function": Measures electric/magnetic fields in three dimensions while varying the height of the probe. This can be applied not only to emission countermeasures but also to visualizing antenna radiation.
- Overlay function for DUT images, CAD drawings, and noise maps (patented technology) is standard in the analysis software. The software can be downloaded for free from the web, and there are no costs associated with subscriptions, making data and information sharing with partner companies and customers smooth.
- Company:森田テック
- Price:Other